Ebsd Characterization of Texture in Tungsten-Rhenium Foils

Uniform single-layer graphene growth on recyclable tungsten foils

Optical characterization of Bangerter foils.

PURPOSE Optical penalization is emerging as an alternative to patching for the treatment of amblyopia. Bangerter foils offer a form of optical penalization that is distinctly different from standard techniques making use of atropine or spectacle lens manipulation, or both, to produce defocus. The authors examined the optical properties of Bangerter foils and compared them with the effect of def...

Elastic trapping of dislocation loops in cascades in ion-irradiated tungsten foils.

Using in situ transmission electron microscopy (TEM), we have observed nanometre scale dislocation loops formed when an ultra-high-purity tungsten foil is irradiated with a very low fluence of self-ions. Analysis of the TEM images has revealed the largest loops to be predominantly of prismatic 1/2〈111〉 type and of vacancy character. The formation of such dislocation loops is surprising since is...

Suppression of radiation-induced point defects by rhenium and osmium interstitials in tungsten

Modeling the evolution of radiation-induced defects is important for finding radiation-resistant materials, which would be greatly appreciated in nuclear applications. We apply the density functional theory combined with comprehensive analyses of massive experimental database to indicate a mechanism to mitigate the effect of radiation on W crystals by adding particular solute elements that chan...

Comparison of Texture in Copper and Aluminum Thin Films Determined by Xrd and Ebsd

X-ray diffraction (XRD) and electron backscatter diffraction (EBSD) are commonly used to perform texture analysis of thin films. However, due to principle differences in data acquisition these techniques can yield disagreeing results. In this paper, we aim to highlight possible error sources with given examples for aluminum and copper thin films. INTRODUCTION Texture in materials has a large in...